| HORIBA Jobin Yvon Inc | Spectroscopic Ellipsometer – Ellipsometry by HORIBA Jobin Yvon |
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Accurate Spectroscopic Ellipsometers for Precise Film Thickness Measurements from HORIBA Jobin Yvon HORIBA Jobin Yvon is a world’s leading manufacturer of spectroscopic ellipsometers used for accurate film thickness and optical constants measurements.
Spectroscopic ellipsometry is a non-destructive optical technique used for thin film, surface and interface characterization.
HORIBA Jobin Yvon manufactures the most sensitive and accurate spectroscopic ellipsometers on the market. Spectroscopic ellipsometry measures film thickness, optical constants (refractive index, extinction coefficient), material composition, optical anisotropy, depolarization factor and more. The UVISEL, a phase modulated spectroscopic ellipsometer covers a wide spectral range from DUV to NIR. The MM-16, an affordable spectroscopic ellipsometer covers the visible spectral range and is the only commercially available spectroscopic ellipsometer to measure in less than 2 seconds the full Mueller matrix of your samples. Spectroscopic ellipsometry characterizes a wide range of materials such as: semiconductors, dielectrics, metals, organics, compounds, alloys, deposited on glass, silicon or flexible substrates. Due to its versatility, spectroscopic ellipsometry covers a wide range of applications from semiconductors, nanotechnologies, photovoltaic, chemistry, biotechnologies, displays, optical coatings and more…
Spectroscopic Ellipsometer Guide (all our ellipsometers include software and are available in ex-situ or in-situ configurations)
A full range of accessories is available for all models above:
Check also our fully automated spectroscopic ellipsometers:
Visit our other Retail Spectrometer Divisions
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